Texas A&M’s Zhan Wang (left) and Sandia’s Jay Johnson (right) receive their Best Poster award at PVSC.
Sandia researcher Jay Johnson (in Sandia’s Photovoltaic & Distributed Systems Integration Dept.) and a collaborating team from Texas A&M University were recognized at the 40th Institute of Electrical and Electronics Engineers (IEEE) PVSC held in Denver, Colorado, on June 8–13, 2014, winning the event’s Best Poster award for “Evaluation Method for Arc Fault Detection Algorithms” (below). The poster highlights a new method to systematically check the effectiveness of algorithms designed to detect PV arc faults.
IEEE selects one “Best Poster Award” for each of the conference’s 12 technical areas, based on clarity of presentation, technical merit, impact, and oral presentation. Jay Johnson’s award was in Area 12: Reliability of PV.